7th NIC@IIT advanced practical workshop
DIRECTORS: PAOLO BIANCHINI & ALBERTO DIASPRO, ISTITUTO ITALIANO DI TECNOLOGIA, GENOVA, ITALY
A limited number of students (approx. 50) will be admitted in order to have no more than 5 students for each instrument or set-up.
On November 28th, Lectures will be open access starting from 2 pm ending at 7,00 pm. All together Farwell for invited speakers, students, and instructors will be offered at 7,30 pm.
Basic topics for students on:
STORM (Stochastic Optical Reconstruction Microscopy), Confocal Microscopy ISM (Image Scanning Microscopy), 2PEFM (Two-photon excitation fluorescence microscopy), SHG (Second Harmonic Generation) microscopy, STED (STimulated Emission Depletion) microscopy, FLIM (Fuorescence Lifetime Imaging Microscopy), FCS (Fluorescence correlation spectroscopy), Expansion microscopy, Label-Free microscopy, Correlative microscopy
Starting from November 29th we will have tutorials and practical sessions.